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Philips Semiconductors
Product specification
TrenchMOS
Ô
transistor
BUK9880-55
Logic level FET
GENERAL DESCRIPTION
QUICK REFERENCE DATA
N-channel enhancement mode logic
SYMBOL PARAMETER
MAX.
UNIT
level field-effect power transistor in a
plastic envelope suitable for surface
V DS
Drain-source voltage
55
V
mounting. The device features very
I D
Drain current
7.5
A
low on-state resistance and has
P tot
Total power dissipation
1.8
W
integral zener diodes giving ESD
T j
Junction temperature
150
˚C
protection. It is intended for use in
R DS(ON)
Drain-source on-state
80
m
W
automotive and general purpose
resistance
V GS = 5 V
switching applications.
PINNING - SOT223
PIN CONFIGURATION
SYMBOL
PIN
DESCRIPTION
d
4
1
gate
2
drain
3
source
g
4
drain (tab)
1
2
3
s
LIMITING VALUES
Limiting values in accordance with the Absolute Maximum System (IEC 134)
SYMBOL PARAMETER
CONDITIONS
MIN.
MAX.
UNIT
V DS
Drain-source voltage
-
-
55
V
V DGR
Drain-gate voltage
R GS = 20 k
W
-
55
V
±
V GS
Gate-source voltage
-
-
10
V
I D
Drain current (DC)
T sp = 25 ˚C
-
7.5
A
I D
Drain current (DC)
On PCB in Fig.2
-
3.5
A
T amb = 25 ˚C
I D
Drain current (DC)
On PCB in Fig.2
-
2.2
A
T amb = 100 ˚C
I DM
Drain current (pulse peak value)
T sp = 25 ˚C
-
40
A
P tot
Total power dissipation
T sp = 25 ˚C
-
8.3
W
P tot
Total power dissipation
On PCB in Fig.2
-
1.8
W
T amb = 25 ˚C
T stg , T j
Storage & operating temperature
-
- 55
150
˚C
ESD LIMITING VALUE
SYMBOL PARAMETER
CONDITIONS
MIN.
MAX.
UNIT
V C
Electrostatic discharge capacitor
Human body model
-
2
kV
voltage
(100 pF, 1.5 k
W
)
April 1998
1
Rev 1.100
22888963.002.png
Philips Semiconductors
Product specification
TrenchMOS
Ô
transistor
BUK9880-55
Logic level FET
THERMAL RESISTANCES
SYMBOL PARAMETER
CONDITIONS
TYP.
MAX.
UNIT
R th j-sp
From junction to solder point
Mounted on any PCB
12
15
K/W
R th j-amb
From junction to ambient
Mounted on PCB of Fig.18
-
70
K/W
STATIC CHARACTERISTICS
T j = 25˚C unless otherwise specified
SYMBOL PARAMETER
CONDITIONS
MIN. TYP. MAX. UNIT
V (BR)DSS
Drain-source breakdown
V GS = 0 V; I D = 0.25 mA
55
-
-
V
voltage
T j = -55˚C
50
-
-
V
V GS(TO)
Gate threshold voltage
V DS = V GS ; I D = 1 mA
1.0
1.5
2.0
V
T j = 150˚C
0.6
-
-
V
T j = -55˚C
-
-
2.3
V
I DSS
Zero gate voltage drain current V DS = 55 V; V GS = 0 V;
-
0.05
10
m
A
T j = 150˚C
-
-
100
m
A
I GSS
Gate source leakage current
V GS =
±
5 V
-
0.02
1
m
A
T j = 150˚C
-
-
5
m
A
±
V (BR)GSS Gate source breakdown voltage I G =
±
1 mA
10
-
-
V
R DS(ON)
Drain-source on-state
V GS = 5 V; I D = 5 A
-
65
80
m
W
resistance
T j = 150˚C
-
-
148
m
W
DYNAMIC CHARACTERISTICS
T mb = 25˚C unless otherwise specified
SYMBOL PARAMETER
CONDITIONS
MIN. TYP. MAX. UNIT
g fs
Forward transconductance
V DS = 25 V; I D = 5 A; T j = 25˚C
4
8
-
S
C iss
Input capacitance
V GS = 0 V; V DS = 25 V; f = 1 MHz
-
500
650
pF
C oss
Output capacitance
-
110
135
pF
C rss
Feedback capacitance
-
60
85
pF
t d on
Turn-on delay time
V DD = 30 V; I D = 7 A;
-
10
15
ns
t r
Turn-on rise time
V GS = 5 V; R G = 10
W
;
-
30
50
ns
t d off
Turn-off delay time
-
30
45
ns
t f
Turn-off fall time
T j = 25˚C
-
30
40
ns
REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS
T j = -55 to 175˚C unless otherwise specified
SYMBOL PARAMETER
CONDITIONS
MIN. TYP. MAX. UNIT
I DR
Continuous reverse drain
T sp = 25˚C
-
-
7.5
A
current
I DRM
Pulsed reverse drain current
T sp = 25˚C
-
-
40
A
V SD
Diode forward voltage
I F = 5 A; V GS = 0 V
-
0.85
1.1
V
t rr
Reverse recovery time
I F = 5 A; -dI F /dt = 100 A/
m
s;
-
38
-
ns
Q rr
Reverse recovery charge
V GS = -10 V; V R = 30 V
-
0.2
-
m
C
April 1998
2
Rev 1.100
22888963.003.png
Philips Semiconductors
Product specification
TrenchMOS
Ô
transistor
BUK9880-55
Logic level FET
AVALANCHE LIMITING VALUE
SYMBOL PARAMETER
CONDITIONS
MIN. TYP. MAX. UNIT
W DSS
Drain-source non-repetitive
I D = 2.5 A; V DD
£
25 V;
-
-
30
mJ
unclamped inductive turn-off
V GS = 5 V; R GS = 50
W
; T sp = 25 ˚C
energy
120
110
100
90
80
70
60
50
40
30
20
10
0
PD%
Normalised Power Derating
100
ID/A
RDS(ON) = VDS/ID
tp =
1 us
10us
10
100 us
DC
1 ms
1
10ms
100ms
0
20
40
60
80
100 120 140
0.1
Tmb / C
1
10
VDS/V
100
Fig.1. Normalised power dissipation.
PD% = 100
×
P D /P D 25 ˚C = f(T sp )
Fig.3. Safe operating area. T sp = 25 ˚C
I D & I DM = f(V DS ); I DM single pulse; parameter t p
120
110
100
90
80
70
60
50
40
30
20
10
0
ID%
Normalised Current Derating
100
Zth/ (K/W)
10
0.5
0.2
0.1
0.05
0.02
1
P
t p
D =
T
0.1
T
t
0
20
40
60
80
100 120 140
0.01
1.0E-06
0.0001
0.01
1
100
Tmb / C
t/s
Fig.2. Normalised continuous drain current.
ID% = 100
I D /I D 25 ˚C = f(T sp ); conditions: V GS
³
5 V
Fig.4. Transient thermal impedance.
Z th j-sp = f(t); parameter D = t p /T
April 1998
3
Rev 1.100
D
t p
×
22888963.004.png
Philips Semiconductors
Product specification
TrenchMOS
Ô
transistor
BUK9880-55
Logic level FET
40
VGS/V = 10
15
5.6
5.4
5.2
5.0
4.8
4.6
4.4
4.2
4.0
3.8
3.6
3.4
3.2
3.0
2.8
2.6
2.4
ID/A
7
6
14
gfs/S
13
30
12
11
20
10
9
10
8
7
6
0
5
0
2
4
VDS/V
6
8
10
0
5
10
ID/A
15
20
Fig.5. Typical output characteristics, T j = 25 ˚C.
I D = f(V DS ); parameter V GS
Fig.8. Typical transconductance, T j = 25 ˚C.
g fs = f(I D ); conditions: V DS = 25 V
115 RDS(ON)/mOhm
2.5
a
BUK98XX-55
Rds(on) normalised to 25degC
110
105
4.2
4
2
4.4
4.6
4.8
100
95
5
1.5
90
85
1
80
75
0.5
70
-100
-50
0
50
100
150
200
5
10
15
20
25
ID/A
Tmb / degC
Fig.6. Typical on-state resistance, T j = 25 ˚C.
R DS(ON) = f(I D ); parameter V GS
Fig.9. Normalised drain-source on-state resistance.
a = R DS(ON) /R DS(ON)25 ˚C = f(T j ); I D = 5 A; V GS = 5 V
20
2.5
VGS(TO) / V
BUK98xx-55
ID/A
max.
15
2
typ.
1.5
10
min.
1
5
0.5
Tj/C =
150
25
0
-100
-50
0
50
100
150
200
0
1
2
3
4
5
VGS/V
Tj / C
Fig.7. Typical transfer characteristics.
I D = f(V GS ) ; conditions: V DS = 25 V; parameter T j
Fig.10. Gate threshold voltage.
V GS(TO) = f(T j ); conditions: I D = 1 mA; V DS = V GS
April 1998
4
Rev 1.100
0
22888963.005.png
Philips Semiconductors
Product specification
TrenchMOS
Ô
transistor
BUK9880-55
Logic level FET
1E-01
Sub-Threshold Conduction
40
IF/A
1E-02
30
Tj/V =
150
25
2%
typ
98%
1E-03
20
1E-04
10
1E-05
1E-05
0
0
0.5
1
1.5
2
0
0.5
1
1.5
2
2.5
3
VSDS/V
Fig.11. Sub-threshold drain current.
I D = f(V GS) ; conditions: T j = 25 ˚C; V DS = V GS
Fig.14. Typical reverse diode current.
I F = f(V SDS ); conditions: V GS = 0 V; parameter T j
1
120
110
100
90
80
70
60
50
40
30
20
10
0
WDSS%
.9
.8
.7
.6
.5
.4
Ciss
.3
.2
.1
Coss
Crss
0
20
40
60
80
100
120
140
0.01
0.1
1
10
100
VDS/V
Tmb / C
Fig.12. Typical capacitances, C iss , C oss , C rss .
C = f(V DS ); conditions: V GS = 0 V; f = 1 MHz
Fig.15. Normalised avalanche energy rating.
W DSS % = f(T sp ); conditions: I D = 2.5 A
6
VDS/V
+
VDD
5
L
VDS = 14V
4
VDS
-
VDS = 44V
VGS
3
-ID/10 0
2
0
T.U.T.
RGS
R 01
1
shunt
0
0
2
4
6
8
10
12
QG/nC
Fig.16. Avalanche energy test circuit.
Fig.13. Typical turn-on gate-charge characteristics.
V GS = f(Q G ); conditions: I D = 7 A; parameter V DS
W DSS =
0.5
×
LI 2
×
BV DSS /(
BV DSS -
V DD )
April 1998
5
Rev 1.100
22888963.001.png
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