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QUAD 3-STATE R-S LATCHES
HCC/HCF4043B
HCC/HCF4044B
QUAD 3-STATE R-S LATCHES
.
QUIESCENT CURRENT SPECIFIED TO 20V
FOR HCC DEVICE
.
3-LEVEL OUTPUTS WITH COMMON OUTPUT
ENABLE
.
5V, 10V, AND 15V PARAMETRIC RATINGS
EY
(Plastic Package)
F
(Ceramic Frit Seal Package)
.
NOR AND NAND CONFIGURATIONS
.
INPUT CURRENT OF 100nA AT 18V AND 25
°
C
FOR HCC DEVICE
.
100% TESTED FOR QUIESCENT CURRENT
.
MEETS ALL REQUIREMENTS OF JEDEC TEN-
TATIVE STANDARD N
M1
(Micro Package)
ORDER CODES :
HCC40XXBF
C1
(Plastic Chip Carrier)
13A, ”STANDARD SPE-
CIFICATIONS FOR DESCRIPTION OF ”B”
SERIES CMOS DEVICES”
°
HCF40XXBM1
HCF40XXBEY
HCF40XXBC1
PIN CONNECTIONS
4043B
DESCRIPTION
The
HCC4043B, HCC4044B
, (extended tempera-
ture range) and the
HCF4043B, HCF4044B
(inter-
mediate temperature range) are monolithic
integrated circuits, available in 16-lead dual in-line
plastic or ceramic package and plastic micropack-
age. The
HCC/HCF4043B
types are quad cross-
coupled 3-state COS/MOS NOR latches and the
HCC/HCF4044B
types are quad cross-coupled 3-
state COS/MOS NAND latches. Each latch has a
separate Q output and individual SET and RESET
inputs. The Q outputs are controlled by a common
ENABLE input. A logic ”1” or ”high” on the ENABLE
input connects the latch states to the Q outputs. A
logic ”0” or ”low” on the ENABLE input disconnects
the latch states from the Q outputs, resulting in an
open circuit condition on the Q outputs. The open
circuit feature allows common bussing of the out-
puts.
4044B
June 1989
1/13
QUAD NOR R-S LATCH-4043B
QUAD NAND R-S LATCH-4044B
.
SEPARATE SET AND RESET INPUT FOR
EACH LATCH
HCC/HCF4043B/4044B
FUNCTIONAL DIAGRAMS
4043B
4044B
ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
V
DD
*
Supply Voltage :
HCC
Types
HCF
Types
– 0.5 to + 20
– 0.5 to + 18
V
V
V
i
Input Voltage
– 0.5 to V
DD
+ 0.5
V
I
I
DC Input Current (any one input)
±
10
mA
P
tot
Total Power Dissipation (per package)
Dissipation per Output Transistor
for T
op
= Full Package-temperature Range
200
mW
100
mW
T
op
Operating Temperature :
HCC
Types
HCF
Types
– 55 to + 125
–40to+85
C
°
C
C
Stresses above those listed under ”Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections
of this specifi cation is not implied. Exposure to absolute maximum rating conditi ons for external periods may affect device reliabili ty.
* All voltage values are referred to V
SS
pin voltage.
Storage Temperature
– 65 to + 150
°
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Value
Unit
V
DD
Supply Voltage :
HCC
Types
HCF
Types
3to18
3to15
V
V
V
I
Input Voltage
0 to V
DD
V
T
op
Operating Temperature :
HCC
Types
HCF
Types
– 55 to + 125
–40to+85
C
°
C
2/13
°
T
stg
°
HCC/HCF4043B/4044B
LOGIC DIAGRAMS
4044B
4043B
STATIC ELECTRICAL CHARACTERISTICS
(over recommended operating conditions)
Test Conditions
Value
Symbol
Parameter
V
I
V
O
|I
O
|V
DD
T
Low
*
25
C
T
Hi g h
*
Unit
(V)
(V)
(
A) (V)
m
Min. Max. Min. Typ. Max. Min. Max.
I
L
Quiescent
Current
0/ 5
5
1
0.02
1
30
HCC
Types
0/10
10
2
0.02
2
60
0/15
15
4
0.02
4
120
0/20
20
20
0.04 20
600
m
A
HCF
Types
0/ 5
5
4
0.02
4
30
0/10
10
8
0.02
8
60
0/15
15
16
0.02 16
120
V
OH
Output High
Voltage
0/ 5
< 1
5
4.95
4.95
4.95
0/10
< 1 10 9.95
9.95
9.95
V
0/15
< 1 15 14.95
14.95
14.95
V
OL
Output Low
Voltage
5/0
< 1
5
0.05
0.05
0.05
10/0
< 1 10
0.05
0.05
0.05
V
15/0
< 1 15
0.05
0.05
0.05
V
IH
Input High
Voltage
0.5/4.5 < 1
5
3.5
3.5
3.5
1/9
< 1 10
7
7
7
V
1.5/13.5 < 1 15
11
11
11
*T
Lo w
=–55
Cfor
HCC
device : – 40
°
Cfor
HCF
device.
Cfor
HCF
device.
The Noise Margin for both ”1” and ” 0” level is : 1V min. with V
DD
= 5V, 2V min. with V
DD
= 10V, 2.5V min. with V
DD
= 15V.
°
Cfor
HCC
device : + 85
°
3/13
°
°
*T
High
= + 125
HCC/HCF4043B/4044B
STATIC ELECTRICAL CHARACTERISTICS
(continued)
Test Conditions
Value
Symbol
Parameter
V
I
V
O
|I
O
|V
DD
T
Low
*
25
°
C
T
Hi g h
*
Unit
(V)
(V)
(
m
A) (V)
Min. Max. Min. Typ. Max. Min. Max.
V
IL
Input Low
Voltage
4.5/0.5 < 1
5
1.5
1.5
1.5
9/1
< 1 10
3
3
3
V
13.5/1.5 < 1 15
4
4
4
I
OH
Output
Drive
Current
0/ 5
2.5
5
– 2
– 1.6 – 3.2
– 1.15
HCC
Types
0/ 5
4.6
5 – 0.64
– 0.51 – 1
– 0.36
0/10
9.5
10 – 1.6
– 1.3 – 2.6
– 0.9
0/15 13.5
15 – 4.2
– 3.4 – 6.8
– 2.4
mA
0/ 5
2.5
5 – 1.53
– 1.36 – 3.2
– 1.1
HCF
Types
0/ 5
4.6
5 – 0.52
– 0.44 – 1
– 0.36
0/10
9.5
10 – 1.3
– 1.1 – 2.6
– 0.9
0/15 13.5
15 – 3.6
– 3.0 – 6.8
– 2.4
I
OL
Output
Sink
Current
HCC
Types
0/ 5
0.4
5
0.64
0.51
1
0.36
0/10
0.5
10
1.6
1.3
2.6
0.9
0/15
1.5
15
4.2
3.4
6.8
2.4
mA
0/ 5
0.4
5
0.52
0.44
1
0.36
HCF
Types
0/10
0.5
10
1.3
1.1
2.6
0.9
0/15
1.5
15
3.6
3.0
6.8
2.4
I
IH
,I
IL
Input
leakage
Current
HCC
Types
0/18
18
±
0.1
±
10
–5
±
0.1
±
1
Any Input
m
A
HCF
Types
0/15
15
±
0.3
±
10
–5
±
0.3
±
1
I
OH
3-state
Output
HCC
Types
0/18 0/18
18
±
0.4
±
10
–4
±
0.4
±
12
m
A
HCF
Types
0/15 0/15
15
±
1.0
±
10
–4
±
1.0
±
7.5
C
I
Input Capacitance
Any Input
5
7.5
pF
Cfor
HCF
device.
The Noise Margin for both ”1” and ” 0” level is : 1V min. with V
DD
= 5V, 2V min. with V
DD
= 10V, 2.5V min. with V
DD
= 15V.
Cfor
HCC
device : + 85
°
DYNAMIC ELECTRICAL CHARACTERISTICS
(T
amb
=25
°
C, C
L
= 50pF, R
L
= 200k
W
,
typical temperature coefficient for all V
DD
values is 0.3%/
°
C, all input rise and fall times = 20ns)
Test Conditions
Value
Symbol
Parameter
Unit
V
DD
(V)
Min. Typ. Max.
t
PLH
,t
PHL
Propagation Delay Time
(SET or RESET to Q)
5
150
300
10
70
140
ns
15
50
100
t
PZH
,t
PHZ
3-state Propagation Delay Time
(ENABLE to Q)
5
115
230
10
55
110
ns
15
40
80
4/13
*T
Lo w
=–55
°
Cfor
HCC
device : – 40
°
Cfor
HCF
device.
*T
High
= + 125
°
HCC/HCF4043B/4044B
DYNAMIC ELECTRICAL CHARACTERISTICS
(continued)
Test Conditions
Value
Symbol
Parameter
Unit
V
DD
(V)
Min. Typ. Max.
t
PL Z
,t
PZL
Propagation Delay Time
5
90
180
10
50
100
ns
15
35
70
t
TLH
,t
THL
Transition Time
5
100
200
10
50
100
ns
15
40
80
t
W
Pulse Width (SET or RESET)
5
160
80
10
80
40
ns
15
40
20
Typical Output Low (sink) Current.
Minimum Output Low (sink) Current Charac-
teristics.
Typical Output High (source) Current Charac-
teristics.
Minimum Output High (source) Current Charac-
teristics.
5/13
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